The International Journal of Applied Sciences

ABSTRACT
In this study, CdSe thin films with different thicknesses (300–900 nm) were prepared using the thermal evaporation technique. Structural and optical properties were investigated using X-ray diffraction (XRD), atomic force microscopy (AFM), and UV–Vis spectroscopy. XRD results confirmed a polycrystalline hexagonal structure with a preferred (002) orientation that became more pronounced with increasing thickness. Optical measurements revealed a direct band gap that decreased with increasing film thickness, accompanied by an increase in absorption coefficient in the visible region. AFM analysis showed improved surface morphology and increased grain size at higher thicknesses. These results indicate that CdSe thin films are promising candidates for optoelectronic and photovoltaic applications.

Keywords: Cdse; Thermal Evaporation; X-Ray; AFM; Polycrystalline.

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Article history

Received : Nov 18, 2025

Revised : Nov 19, 2025

Accepted : Dec 24, 2025

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Acknowledgment	None
Author Contribution	All authors contributed equally to the main contributor to this paper. All authors read and approved the final paper.
Conflicts of Interest	“The authors declare no conflict of interest.”
Funding	“This research received no external funding”